Ceyear 1435-V Series Signal Generator

Based on innovative technologies, the 1435-V series signal generator achieves balance in terms of performance, economy and volumetric weight. It supports arbitrary modulation of wave data downloaded in 5 formats, and enables users to edit, download, and configure the waveforms as required to complete various signal simulations and meet the testing requirements of various complex signals. Its baseband signal generator is easy to set up and has excellent performance. It supports real-time occurrence of general digital modulation signals in more than 20 formats such as PSK, QAM, FSK and MSK. It also has excellent spectral purity, with a single side band (SSB) phase noise of -136dBc/Hz (when the carrier is 1GHz and the frequency offset is 10kHz) or -120dBc/Hz (when the carrier is 6GHz and the frequency offset is 10kHz). It provides a high power output and a large dynamic range, with the maximum output power up to 22dBm@3GHz and an output power dynamic range greater than 150dB. Besides, it is equipped with a 7-inch high-sensitivity LED touch screen, and supports operation by touch screen, panel buttons, rotary knobs, external mouse and keyboard, etc., which fully upgrades the users’ operation experience. It adopts portable 3U chassis structure and is featured by small size and light weight, and thus is easy to carry. It can achieve exceptional performance even in a compact space, which meets both the test requirements for high performance in the equipment development phase and the test requirements for high efficiency in the production phase.

Main Features:

1. Advanced Vector Modulation Capabilities

Broadband Generation: Equipped with a 200 MHz internal modulation bandwidth and up to 2 GHz external modulation real-time bandwidth for testing wideband signals.
Metrology-Grade Accuracy: Delivers excellent vector modulation precision with an EVM (Error Vector Magnitude) of less than 1.4% (typical <1.0%) for frequencies up to 40 GHz, and <2.5% up to 67 GHz.
Universal Format Support: Supports real-time generation of over 20 standard digital modulation formats, including PSK, QAM, FSK, and MSK.
Flexible Waveform Editing: Includes a large-capacity (2 G sampling points) waveform storage, allowing users to download and play back complex, long-duration arbitrary waveform data to simulate real-world interference or custom signals.

2. Frequency Range and Spectral Purity

Wide Coverage: Frequency coverage ranges from 100 kHz up to 67 GHz (model-dependent: 3 GHz, 6 GHz, 10 GHz, 20 GHz, 40 GHz, 50 GHz, or 67 GHz).
Low Phase Noise: Engineered for high-level receiver testing, it offers a typical SSB phase noise of -126 dBc/Hz (10 GHz carrier at 10 kHz offset) and -142 dBc/Hz (1 GHz carrier at 10 kHz offset).

3. Power Performance

High Output Power: Capable of high-power output (up to 1W/+30 dBm at 20 GHz with optional hardware), often eliminating the need for external amplifiers in test setups.
Wide Dynamic Range: Features a massive 140 dB – 150 dB output dynamic range, making it suitable for testing the sensitivity and blocking characteristics of high-performance receivers.

4. Advanced Pulse Modulation

Radar Testing: Specifically optimized for pulse-heavy environments, offering pulse modulation depths greater than 80 dB and rise/fall times under 10 ns.
Complex Sequences: Supports sophisticated pulse features like double pulses, pulse bursts, and staggered pulse repetition frequencies, crucial for electronic warfare and radar simulation.

5. Intuitive User Interface

Modern Interaction: Features a large 10.1-inch LED touchscreen (1280×800 resolution) with a graphical, window-based menu that simplifies complex setup procedures.
Connectivity: Includes versatile control interfaces for automated testing, such as LAN, USB, and GPIB, and supports SCPI command sets for integration into large-scale ATE (Automatic Test Equipment) systems.

6. Typical Applications

Satellite Communication: Providing repeatable, high-reliability signals for transponder and receiver testing.
Doppler Radar & EW: Simulating complex interference and multi-path environments.
High-End Component/System Testing: Acting as a high-quality local oscillator (LO) substitute or clock source for precise performance validation.